The innovative Y-ETI test adapter from Yamaichi Electronics is designed for maximum flexibility in testing electronic assemblies. It enables contacting of standard applications from low signal quality and larger test pitch up to high performance embedded solutions with test pitch starting from ≥0.25mm. Yamaichi Electronics is also a member of SGET.

Advantages

• Universal: One test adapter for various test system configurations
• Scaleable: For fine pitch from 0.25mm to standard test pad distances
• Optimized: High signal quality and reliability from the device under test (DUT) to the test system
• Individual: Test setup configuration either using cassette or test application board (TAB)